@bbdra - How is this thread relevant and where are you going with your query? PC components are low power devices. Inject more than few miliamps into the RAM or CPU and you destroy them. Send enough high frequency energy at them causes the same effect. Have you ever seen what a near lightning strike does to an unprotected PC?
In terms of safety and privacy, this could be important, for example, for searching of cryptokeys. Just high temperatures cannot be a risk?
4.2. Hot Carriers
High-energy electrons can cause other problems as
well. A very obvious one is that the device heats up
during operation because of collisions with the atoms in
the lattice, at least one effect of the heating being the
generation of further high-speed electrons. A problem
which is particularly acute in MOSFETs with very
small device dimensions is that of hot carriers which
are accelerated to a high energy due to the large electric
fields which occur as device dimensions are reduced
(hot-carrier effects in newer high-density DRAMs have
become so problematic that the devices contain internal
voltage converters to reduce the external 3.3 or 5V
supply by one or two volts to help combat this problem,
and the most recent ones use a supply voltage of 2.5V
for similar reasons). In extreme cases these hot
electrons can overcome the Si-SiO2 potential barrier
and be accelerated into the gate oxide and stay there as
excess charge [14]. The detrapping time for the
resulting trapped charge can range from nanoseconds to
days [15], although if the charge makes it into the
silicon nitride passivation layer it’s effectively there
permanently (one study estimated a lifetime in excess
of 30 years at 150°C) [16].